【24h】

Photolurninescence band near 2.2 eV in gamma-irradiated oxygen-deficient silica glass

机译:γ射线辐照的缺氧石英玻璃中的光致发光带接近2.2 eV

获取原文
获取原文并翻译 | 示例
           

摘要

Our previous studies have reported different radial distributions of the 2.25 eV photoluminescence (PL) band (full width at half maximum (FWHM): similar to0.4 eV, decay time (T): similar to25 ns) under 3.8 and 4.66 eV excitation in gamma-irradiated oxygen-deficient silica glass. As a result of our measurements, we believe that the origin of this PL band is different for 3.8 and 4.66 eV excitations. In order to understand this difference better, we measured the time-resolved PL spectra and decay time of the near 2.2 eV band under 3.49 and 4.66 eV excitation in gamma-irradiated oxygen-deficient silica glass. We have found two PL bands at approximately 2.2 eV in the gamma-irradiated oxygen-deficient silica glass. One band was observed at 2.25 eV (described above) under 4.66 eV excitation; and the other, at 2.15 eV (FWHM: similar to0.5 eV, r: similar to150 ns) under 3.49 eV excitation. Two PL bands, one at 2.15 eV and the other at 2.25 eV coexist with excitation at 3.49, 3.8 and 4.66 eV. From our results, we conclude that the difference in the radial distributions of the 2.25 eV PL under 3.8 and 4.66 eV excitation is due to the 2.15 eV PL band. The main component of the observed PL intensity under 3.8 eV excitation was the 2.15 eV PL component, and the main component of the observed PL intensity under 4.66 eV excitation was the 2.25 eV PL component. (C) 2004 Elsevier B.V. All rights reserved.
机译:我们先前的研究报告了在3.8和4.66 eV激发下,2.25 eV光致发光(PL)谱带的不同径向分布(半峰全宽(FWHM):近似于0.4 eV,衰减时间(T):近似于25 ns)。 γ射线辐照的缺氧石英玻璃。根据我们的测量结果,我们相信对于3.8和4.66 eV激发,该PL波段的起源是不同的。为了更好地理解这种差异,我们测量了γ辐照的缺氧石英玻璃在3.49和4.66 eV激发下在2.2 eV附近的时间分辨的PL光谱和衰减时间。我们在γ射线辐照的缺氧石英玻璃中发现了两个大约2.2 eV的PL带。在4.66 eV激发下,在2.25 eV(如上所述)观察到一个谱带;另一个是在3.49 eV激发下的2.15 eV(FWHM:近似于0.5 eV,r:近似于150 ns)。两个PL波段,一个处于2.15 eV,另一个处于2.25 eV,并与3.49、3.8和4.66 eV的激励共存。根据我们的结果,我们得出结论,在3.8和4.66 eV激励下,2.25 eV PL的径向分布的差异是由于2.15 eV PL带引起的。在3.8eV激发下观察到的PL强度的主要成分是2.15eV PL成分,在4.66eV激发下观察到的PL强度的主要成分是2.25eV PL成分。 (C)2004 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号