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A physical model to predict stiction in MEMS

机译:预测MEMS静摩擦的物理模型

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摘要

One of the most important reliability problems in micro-electromechanical systems (MEMSs) is stiction, the adhesion of contacting surfaces due to surface forces. After reviewing the known physical theory, and the measurement method commonly used to investigate stiction, we present a model that can be used to investigate the sensitivity of MEMS to stiction. It quantitatively predicts the surface interaction energy of surfaces in contact. Included in the model is the roughness of the contacting surfaces and the environmental conditions (humidity and temperature). This is done by describing the surface interaction energy as a function of the distance between the surfaces. This distance is not a unique number, but rather a distribution of distances. It is shown that, if we know this distribution, we can calculate the surface interaction energy. The model is suitable for the prediction of forces due to capillary condensation and molecular interactions. [References: 29]
机译:微机电系统(MEMS)中最重要的可靠性问题之一是静摩擦力,即由于表面力造成的接触表面的附着力。在回顾了已知的物理理论和通常用于研究静摩擦的测量方法之后,我们提出了一个可用于研究MEMS对静摩擦的敏感性的模型。它定量地预测了接触表面的表面相互作用能。该模型包括接触表面的粗糙度和环境条件(湿度和温度)。这是通过将表面相互作用能描述为表面之间距离的函数来完成的。这个距离不是唯一的数字,而是距离的分布。结果表明,如果我们知道该分布,则可以计算表面相互作用能。该模型适用于预测由于毛细管凝聚和分子相互作用而产生的力。 [参考:29]

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