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首页> 外文期刊>Journal of Micromechanics and Microengineering >Long-term evaluation of hermetically glass frit sealed silicon to Pyrex wafers with feedthroughs
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Long-term evaluation of hermetically glass frit sealed silicon to Pyrex wafers with feedthroughs

机译:带有通孔的耐热玻璃密封硅对耐热玻璃的长期评估

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摘要

The reliability of bonding silicon to Pyrex wafers using a reflowed glass frit seal is examined in this paper. The Pyrex wafers have metal feedthroughs, which are used to actuate and capacitively sense a single-crystal, silicon resonator. Long-term, high-temperature storage conditions for chips with and without getters are examined. The reflowed glass seal is demonstrated to be hermetic for years at high temperature using both diaphragm deflection and the Q and frequency of resonators as a vacuum indicator. The use of a thin film getter is found to eliminate Q hysteresis due to gas desorption and adsorption, observed in other resonators studies.
机译:本文研究了使用回流玻璃粉密封将硅粘结到派热克斯晶片上的可靠性。 Pyrex晶圆具有金属馈通,用于激励和电容感应单晶硅谐振器。检查有无吸气剂的芯片的长期高温存储条件。事实证明,使用隔膜挠度以及谐振器的Q和频率作为真空指示器,回流玻璃密封件在高温下可密封多年。发现在其他谐振器研究中发现,使用薄膜吸气剂可消除由于气体的脱附和吸附而引起的Q磁滞现象。

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