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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Nanoscale investigation of side wall and surface domain structures in multilayer PbTiO3/PbZr0.3Ti0.7O3/PbTiO3 thin films
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Nanoscale investigation of side wall and surface domain structures in multilayer PbTiO3/PbZr0.3Ti0.7O3/PbTiO3 thin films

机译：多层PbTiO3 / PbZr0.3Ti0.7O3 / PbTiO3薄膜的侧壁和表面畴结构的纳米尺度研究

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摘要

Nanoscale domain structures of multilayer PbTiO3/PbZr0.3Ti0.7O3/PbTiO3 (PT/PZT/PT) thin films are investigated by three-dimensional piezoresponse force microscopy (PFM) in the side wall and on the bare surface. Topography images of the side wall show that the thin films have a compact columnar grain microstructure, and two or three grains stacked in the direction normal to the thin film plane can be observed clearly. The nanoscale three-dimensional piezoresponse images of the side wall and the surface exhibit a random distribution of the domains' orientation in the PT/PZT/PT thin films, but that all the grains in the side wall have a piezoresponse and the various changes in the magnitude of the piezoresponse obtained by the polarized voltage indicate that no a domains, amorphous or nonferroelectric structure can be detected on the thin films' surface. The fine and clear PFM images with various contrasts in the side wall exhibit that the stacked grains also have a random polarization direction. These stacked grains with a random polarization direction result in the reduction of the integral piezoresponse; therefore, various grey contrasts can be shown in the PFM images detected on the bare surface of the thin films.
机译：通过三维压电响应力显微镜（PFM）在侧壁和裸露表面上研究了多层PbTiO3 / PbZr0.3Ti0.7O3 / PbTiO3（PT / PZT / PT）薄膜的纳米级畴结构。侧壁的形貌图像表明，薄膜具有致密的柱状晶粒微结构，并且可以清楚地观察到在垂直于薄膜平面的方向上堆叠的两个或三个晶粒。侧壁和表面的纳米级三维压电响应图像在PT / PZT / PT薄膜中显示出畴取向的随机分布，但是侧壁中的所有晶粒都具有压电响应，并且在表面上的各种变化通过极化电压获得的压电响应的大小表明，在薄膜表面上没有检测到畴，非晶或非铁电结构。在侧壁上具有各种对比度的精细清晰的PFM图像表明，堆积的晶粒也具有随机的偏振方向。这些具有随机极化方向的堆积晶粒导致积分压电响应的减小;因此，可以在薄膜的裸露表面上检测到的PFM图像中显示各种灰度对比。

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