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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Resistive switching properties and low resistance state relaxation in Al/Pr0.7Ca0.3MnO3/Pt junctions
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Resistive switching properties and low resistance state relaxation in Al/Pr0.7Ca0.3MnO3/Pt junctions

机译:Al / Pr0.7Ca0.3MnO3 / Pt结中的电阻切换特性和低电阻态弛豫

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摘要

Metal/insulator/metal structures composed of active Al top electrodes (TEs) and oxygen-deficient Pr0.7Ca0.3MnO3 (PCMO) insulator layers are prepared on platinized silicon substrates. The junction resistance exhibits an obvious negative differential resistance region in the first bias sweep and an irreversible increase from 2 to 100M Omega in repeated +/- 4 V sweeps. The pulse duration needed to fully switch the junctions is found to be on the order of milliseconds. When 100-500 mu s negative pulses are used, the junctions show an incomplete switch to the low resistance state (LRS) which exhibits fluctuating resistances. The fluctuation in the LRS is suppressed and the high-to-low resistance ratio increases gradually when the negative pulse duration is increased from 100 to 500 mu s. For relaxed junctions, pulse switching experiments reveal that the LRS undergoes a dynamically stable process at the beginning and then reaches a lower and metastable resistance value. Resistance retention tests also indicate that the high resistance state is very stable, while the metastable LRS gradually relaxes to higher resistance values. The experimental results are discussed with the formation and dissociation of an interfacial AlOx layer at the interface between Al TEs and PCMO layers.
机译:在镀铂硅基板上制备由有源Al顶部电极(TE)和缺氧的Pr0.7Ca0.3MnO3(PCMO)绝缘层组成的金属/绝缘体/金属结构。结电阻在第一次偏置扫描中表现出明显的负差分电阻区域,并且在重复的+/- 4 V扫描中从2到100M Omega不可逆地增加。完全切换结点所需的脉冲持续时间约为毫秒。当使用100-500μs的负脉冲时,结点会显示不完全切换到低电阻状态(LRS),该状态显示出波动的电阻。当负脉冲持续时间从100μs增加到500μs时,LRS的波动得到抑制,高/低电阻比逐渐增加。对于松弛的结,脉冲开关实验表明,LRS在开始时经历了动态稳定的过程,然后达到了较低且亚稳态的电阻值。电阻保持测试还表明,高电阻状态非常稳定,而亚稳态LRS逐渐松弛到更高的电阻值。通过在Al TEs和PCMO层之间的界面上形成界面AlOx层并使其解离来讨论实验结果。

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