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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Nondestructive determination of sheet carrier density in pseudomorphic AlGaAs/InGaAs/GaAs high electron mobility transistor structures by room-temperature photoluminescence spectra
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Nondestructive determination of sheet carrier density in pseudomorphic AlGaAs/InGaAs/GaAs high electron mobility transistor structures by room-temperature photoluminescence spectra

机译:室温光致发光光谱法无损测定假晶AlGaAs / InGaAs / GaAs高电子迁移率晶体管结构中的薄层载流子密度

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This paper describes a nondestructive method to determine the sheet carrier density of pseudomorphic high electron mobility transistor structures by fitting the room-temperature photoluminescence (PL) spectra. The sheet carrier densities determined were in sufficiently good agreement with values determined by Hall measurements for different samples with different mole fractions, delta-doping densities and well widths. For single-doped AlGaAs/InGaAs quantum wells, the dominant emission is the transitions from the first electron subband to the first heavy hole subband, from the first electron subband to the second heavy hole subband, and from the second electron subband to the first heavy hole subband. [References: 11]
机译:本文介绍了一种通过拟合室温光致发光(PL)光谱来确定拟态高电子迁移率晶体管结构的薄层载流子密度的无损方法。对于具有不同摩尔分数,δ掺杂密度和阱宽度的不同样品,所确定的薄片载体密度与通过霍尔测量所确定的值足够好地一致。对于单掺杂AlGaAs / InGaAs量子阱,主要发射是从第一电子子带到第一重空穴子带,从第一电子子带到第二重空穴子带以及从第二电子子带到第一重子离子的跃迁。孔子带。 [参考:11]

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