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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Frequency-dependent closed-form expressions for inductance and resistance of a single interconnect on a silicon substrate
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Frequency-dependent closed-form expressions for inductance and resistance of a single interconnect on a silicon substrate

机译:硅衬底上单个互连的电感和电阻的频率相关闭式表达式

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摘要

New closed-form expressions to calculate frequency-dependent distributed inductance and the associated distributed series resistance of a sin-le interconnect on a lossy silicon substrate (CMOS technology) are presented. The proposed analytical model for series impedance is based on a self-consistent field method and the vector magnetic potential equation. It is shown that the calculated frequency-dependent distributed inductance and the associated resistances are in good agreement with the results Obtained from rigorous full-wave solutions and CAD-oriented equivalent-circuit modelling approach. [References: 9]
机译:提出了新的闭合形式的表达式,用于计算有损耗硅衬底上的单线互连的频率相关分布电感和相关的分布串联电阻(CMOS技术)。提出的串联阻抗分析模型基于自洽场方法和矢量磁势方程。结果表明,所计算的频率相关的分布电感和相关的电阻与严格的全波解决方案和面向CAD的等效电路建模方法获得的结果非常吻合。 [参考:9]

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