Microwave Impedance of a Tunnel Junction in the Theory of a Near-Field Microscope with Atomic Resolution

S. A. Korolyov; A. N. Reznik

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Microwave Impedance of a Tunnel Junction in the Theory of a Near-Field Microscope with Atomic Resolution

机译：原子分辨率近场显微镜理论中隧道结的微波阻抗

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A theory is constructed for a near-field microwave microscope operating under tunneling breakdown between a probe and a conducting sample. Its informative characteristics are determined by the probe impedance, which is formed from the capacitive impedance Z_p of the near-field probe–sample interaction and tunnel junction impedance Z_t. A technique whereby the impedance Z_p is calculated using coaxial geometry of the probe is developed. Some properties of the impedance Z_t defined via the developed theory and published experimental data are investigated.

机译：为在探针和导电样品之间的隧穿击穿下工作的近场微波显微镜建立了理论。它的信息特性由探针阻抗决定，探针阻抗由近场探针与样品相互作用的电容性阻抗Z_p和隧道结阻抗Z_t构成。开发了一种使用探针的同轴几何来计算阻抗Z_p的技术。研究了通过发展的理论和公开的实验数据定义的阻抗Z_t的一些特性。

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《Journal of surface investigation: x-ray, synchrotron and neutron techniques》 |2016年第2期|共5页
作者
S. A. Korolyov; A. N. Reznik;
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原文格式 PDF
正文语种 eng
中图分类原子核物理学、高能物理学;
关键词
near-field microscope; tunneling contact; microwave impedance;

机译：近场显微镜;隧道接触;微波阻抗;

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专利

1. Microwave Impedance of a Tunnel Junction in the Theory of a Near-Field Microscope with Atomic Resolution [J] . S. A. Korolyov, A. N. Reznik Journal of surface investigation: x-ray, synchrotron and neutron techniques . 2016,第2期

机译：原子分辨率近场显微镜理论中隧道结的微波阻抗
2. Quantitative impedance characterization of sub-10nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope [J] . Fei Wang, Nicolas Clément, Damien Ducatteau, Nanotechnology . 2014,第40期

机译：干涉扫描微波显微镜定量分析低于10nm规模电容器和隧道结的阻抗
3. VAN-DER-WAALS-ATOMIC-TRAP IN A SCANNING-TUNNELING-MICROSCOPE JUNCTION - TIP SHAPE, DYNAMICAL EFFECTS, AND TUNNEL CURRENT SIGNATURES [J] . Bouju X., Tang H., Joachim C., Physical Review, B. Condensed Matter . 1997,第24期

机译：扫描隧道微结中的范德华原子陷阱-尖端形状，动力效应和隧道电流信号
4. Calculating Terahertz Near-fields in the Scanning Tunneling Microscope Junction [C] . Peter H. Nguyen, Vedran Jelic, Graham J. Hornig, Conference on Lasers and Electro-Optics . 2018

机译：计算扫描隧道显微镜交界处的太赫兹近场
5. Quantitative materials contrast at high spatial resolution with a novel near-field scanning microwave microscope. [D] . Imtiaz, Atif. 2005

机译：定量材料与新型近场扫描微波显微镜在高空间分辨率下形成对比。
6. Near-Field Spectral Response of Optically ExcitedScanning Tunneling Microscope Junctions Probed by Single-MoleculeAction Spectroscopy [O] . Hannes Böckmann, Melanie Müller, Adnan Hammud, -1

机译：光激发的近场光谱响应单分子探测的扫描隧道显微镜结。动作光谱
7. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy [O] . Oral, A., Grimble, R. A., Ozer, H. O., 2003

机译：高灵敏度非接触原子力显微镜/扫描隧道显微镜（nc AFM / STM），工作于亚埃振荡振幅，用于原子分辨率成像和力谱

Microwave Impedance of a Tunnel Junction in the Theory of a Near-Field Microscope with Atomic Resolution

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