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首页> 外文期刊>Journal of Superconductivity >Determination of the Superconducting Penetration Depth From Coplanar-Waveguide Measurements
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Determination of the Superconducting Penetration Depth From Coplanar-Waveguide Measurements

机译：从共面波导测量确定超导穿透深度

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摘要

We introduce a novel transmission-line method for determining the penetration depth in thin high-temperature superconducting (HTS) films. The method is based on the accurate measurement of the inductance per unit length of a superconducting coplanar-waveguide (CPW) transmission line fabricated on the HTS sample. Using the experimentally obtained inductance per unit length, we interpolate the penetration depth from a table of numerically determined values of inductance (per unit length) as a function of penetration depth, calculated from a coupled transmission-line model. A novelty of our procedure is the utilization of the multiline thru-reflect-line (TRL) method and the calibration-comparison method to accurately determine the inductance per unit length of the superconducting transmission line. By measuring different CPW geometries patterned onto the same thin-film sample, we can verify our penetration depth values. We demonstrate this technique by extracting the penetration depth for several different HTS films at 76 K. Estimated uncertainties in the extracted penetration depth are also provided.
机译：我们介绍了一种新颖的传输线方法，用于确定高温超导（HTS）薄膜中的穿透深度。该方法基于在HTS样品上制造的超导共面波导（CPW）传输线每单位长度电感的准确测量。使用实验获得的每单位长度的电感，我们从数值确定的电感值（每单位长度）的表中插入穿透深度，该值是根据耦合传输线模型计算得出的穿透深度的函数。我们的程序的新颖之处在于利用多线直通反射线（TRL）方法和校准比较方法来准确确定超导传输线每单位长度的电感。通过测量图案化到同一薄膜样本上的不同CPW几何形状，我们可以验证渗透深度值。我们通过提取几种不同的HTS薄膜在76 K处的穿透深度来演示该技术。还提供了估计的穿透深度的不确定性。

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