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首页> 外文期刊>Journal of Semiconductors >A digital calibration technique for an ultra high-speed wide-bandwidth folding and interpolating analog-to-digital converter in 0.18-μm CMOS technology
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A digital calibration technique for an ultra high-speed wide-bandwidth folding and interpolating analog-to-digital converter in 0.18-μm CMOS technology

机译:采用0.18μmCMOS技术的超高速宽带折叠和内插模数转换器的数字校准技术

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摘要

A digital calibration technique for an ultra high-speed folding and interpolating analog-to-digital converter in 0.18-μm CMOS technology is presented. The similar digital calibration techniques are taken for high 3-bit flash converter and low 5-bit folding and interpolating converter, which are based on well-designed calibration reference, calibration DAC and comparators. The spice simulation and the measured results show the ADC produces 5.9 ENOB with calibration disabled and 7.2 ENOB with calibration enabled for high-frequency wide-bandwidth analog input.
机译:提出了一种采用0.18μmCMOS技术的超高速折叠内插模数转换器的数字校准技术。高3位闪存转换器和低5位折叠内插转换器采用了类似的数字校准技术,它们基于精心设计的校准基准,校准DAC和比较器。香料仿真和测量结果表明,对于高频宽带模拟输入,ADC禁用校准后产生5.9 ENOB,启用校准时产生7.2 ENOB。

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