Determination of Optical Birefringence by Using Off-axis Transmission Ellipsometry

Gerald E. Jellison; Christopher M. Rouleau

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Determination of Optical Birefringence by Using Off-axis Transmission Ellipsometry

机译：离轴透射椭圆光度法测定光学双折射

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Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO_3, and 6H-SiC single-crystals are examined and the miscut direction and the spectroscopic birefringence are determined. While all materials show strong dispersion in birefringence, ZnO exhibits a distinct isotropic point at 396.8 nm.

机译：利用在小入射角处的透射椭圆光度法，显示出c切单轴样本可以用于确定光轴相对于入射平面的切分以及光谱双折射的非常准确的值。例如，检查了ZnO，LiNbO_3和6H-SiC单晶的晶片，并确定了误切方向和光谱双折射。尽管所有材料在双折射方面均表现出强分散性，但ZnO在396.8 nm处表现出明显的各向同性点。

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《Applied optics》 |2005年第16期|共7页
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Gerald E. Jellison; Christopher M. Rouleau;
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1. Determination of Optical Birefringence by Using Off-axis Transmission Ellipsometry [J] . Gerald E. Jellison, Christopher M. Rouleau Applied Optics . 2005,第16期

机译：离轴透射椭圆光度法测定光学双折射
2. Determination of Optical Birefringence by Using Off-axis Transmission Ellipsometry [J] . Gerald E. Jellison, Christopher M. Rouleau Applied optics . 2005,第16期

机译：离轴透射椭圆光度法测定光学双折射
3. Model-free determination of the birefringence and dichroism in c-cut crystals from transmission ellipsometry measurements [J] . Applied optics . 2020,第7期

机译：无模型测定传输椭圆测量的C型晶体中的双折射和二色性的测定
4. Electric field-induced birefringence measurements in nuclear detector materials using transmission two-modulator generalized ellipsometry (2-MGE) [C] . Jellison, G.E., Jr. . 2004

机译：使用透射二调制广义椭圆仪（2-MGE）的核探测器材料中的电场感应双折射测量
5. Determination of Electrostatic Potential and Charge Distribution of Semiconductor Nanostructures using Off-axis Electron Holography. [D] . Li, Luying. 2011

机译：使用离轴电子全息图确定半导体纳米结构的静电势和电荷分布。
6. Depth Discrimination in Diffuse Optical Transmission Imaging by Planar Scanning Off-Axis Fibers: INITIAL Applications to Optical Mammography [O] . Jana M. Kainerstorfer, Yang Yu, Geethika Weliwitigoda, -1

机译：在扩散光透射成像深度鉴别由平面扫描离轴纤维：最初的应用到光乳房造影检查
7. Simple transmission ellipsometry method for measuring the electric-field-induced birefringence in PLZT thin films [O] . Wang J, Wang DY, Li F, 2004

机译：测量PLZT薄膜中电场引起的双折射的简单透射椭圆法
8. Determination of the Optical Properties of Organic Thin Films by Spectroscopic Ellipsometry. [R] . Sward, M. L. 1990

机译：光谱椭偏法测定有机薄膜的光学性质。

Determination of Optical Birefringence by Using Off-axis Transmission Ellipsometry

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