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Estimation of the phase error in interferometric measurements by evaluation of the speckle field intensity

机译:通过评估散斑场强度来估计干涉测量中的相位误差

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摘要

Intensities recorded with CCD or CMOS sensors represent spatially averaged values of the intensityacross the area of a pixel. In this work we investigate the influence of spatial averaging in interferograms on the evaluated phase from an object wave with well resolved, fully developed speckles. Based on an analytical description of the averaging process, a procedure is developed to create a quality map for the evaluated phase, in order to give an estimation of the expected error at each point. The proposed method uses only the local intensity distribution of the object wave for the qualification of the phase values. The theoretical results are tested and verified by means of numerically generated objective and subjective speckle fields.
机译:用CCD或CMOS传感器记录的强度代表了整个像素区域上强度的空间平均值。在这项工作中,我们研究了干涉图中的空间平均对来自具有良好分辨的,完全发达的斑点的物波的评估相位的影响。根据对平均过程的分析描述,开发了一种程序来为评估阶段创建质量图,以便对每个点的预期误差进行估算。所提出的方法仅使用物波的局部强度分布来确定相位值。通过数值生成的主观和主观散斑场对理论结果进行了测试和验证。

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