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首页> 外文期刊>Applied optics >Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index
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Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index

机译：自参考光谱干涉仪，可同时测量厚度和折射率

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摘要

We present a method for simultaneously measuring the thickness and the group refractive index of a specimen using self-referenced spectral-domain fiber-based interferometry. By removing the scanning part and using the fiber-based configuration, the system complexity and stability could be significantly improved. To minimize the system drift, we utilized the signals originated from the fiber ends of both arms. Implementing in a self-referenced configuration, we could improve the measurement accuracy down to a decimal place. Experimental measurements were made with a 1.555 mm thick fused silica plate. At 814 nm the thickness was measured as 1.5546 +- 0.0002 mm, and at the same time, the group index was obtained as 1.4627 +- 0.0002.
机译：我们提出了一种使用自参考光谱域基于光纤的干涉仪同时测量样品厚度和折射率的方法。通过删除扫描部分并使用基于光纤的配置，可以显着提高系统的复杂性和稳定性。为了最大程度地减少系统漂移，我们利用了来自两个光纤末端的信号。在自引用配置中实施，我们可以将测量精度提高到小数位。用1.555mm厚的熔融石英板进行实验测量。在814nm处测得的厚度为1.5546±0.0002mm，同时获得的组指数为1.4627±0.0002。

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