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Interferometric lithography for nanoscale feature patterning: a comparative analysis between laser interference, evanescent wave interference, and surface plasmon interference

机译:用于纳米级特征图案的干涉光刻:激光干涉,van逝波干涉和表面等离子体激元干涉之间的比较分析

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摘要

In this paper, we experimentally demonstrate and compare single-exposure multiple-beam interference lithography based on conventional laser interference, evanescent wave interference, and surface plasmon interference. The proposed two-beam and four-beam interference approaches are carried out theoretically and verified experimentally, employing the proposed configurations so as to realize the patterning of one- and two-dimensional periodic features on photoresists. A custom-fabricated grating is employed in the configuration in order to achieve two- and four-beam interference.
机译:在本文中,我们通过实验证明和比较了基于常规激光干涉,e逝波干涉和表面等离子体激元干涉的单曝光多光束干涉光刻。理论上进行了提出的两光束和四光束干涉方法,并利用提出的配置进行了实验验证,以实现在光致抗蚀剂上的一维和二维周期性特征的图案化。为了实现两束和四束干涉,在配置中使用了定制的光栅。

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