Selective reflection technique as a probe to monitor the growth of metallic thin film on dielectric surfaces

Weliton Soares Martins; Marcos Oria; Martine Chevrollier; Thierry Passerat de Silans

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Selective reflection technique as a probe to monitor the growth of metallic thin film on dielectric surfaces

机译：选择性反射技术作为探针来监测介电表面上金属薄膜的生长

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Controlling thin film formation is technologically challenging. The knowledge of physical properties of the film and of the atoms in the surface vicinity can help improve control over the film growth. We investigate the use of the well-established selective reflection technique to probe the thin film during its growth, simultaneously monitoring the film thickness, the atom-surface van der Waals interaction, and the vapor properties in the surface vicinity.

机译：控制薄膜形成在技术上具有挑战性。薄膜和表面附近原子的物理性质的知识可以帮助改善对薄膜生长的控制。我们研究了使用成熟的选择性反射技术来探测薄膜的生长过程，同时监测薄膜的厚度，原子表面范德华相互作用以及表面附近的蒸汽性质。

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《Applied optics》 |2013年第24期|共7页
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Weliton Soares Martins; Marcos Oria; Martine Chevrollier; Thierry Passerat de Silans;
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1. Selective reflection technique as a probe to monitor the growth of metallic thin film on dielectric surfaces [J] . Weliton Soares Martins, Marcos Oria, Martine Chevrollier, Applied optics . 2013,第24期

机译：选择性反射技术作为探针来监测介电表面上金属薄膜的生长
2. Laser probing of anisotropic ultrathin dielectric films on absorbing materials via differential reflection characteristics [J] . Peep Adamson Optics & Laser Technology . 2009,第4期

机译：通过差分反射特性对吸收材料上的各向异性超薄介电膜进行激光探测
3. Broadband selective solar absorber based on dielectric-filled anti-reflection coated film-coupled two-dimensional metallic photonic crystals [J] . Li Hui, Wu Dong, Liu Yumin, Japanese journal of applied physics . 2018,第11期

机译：基于电介质填充抗反射涂层膜耦合二维金属光子晶体的宽带选择性太阳能吸收器
4. Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films [C] . P. Adamson Optical Materials and Applications . 2004

机译：纳米层状介质的特征反射角和超薄介电膜的光学探测
5. Metal thin film growth on multimetallic surfaces: From quaternary metallic glass to binary crystal. [D] . Jing, Dapeng. 2010

机译：多金属表面上的金属薄膜生长：从四元金属玻璃到二元晶体。
6. Experimental Investigation of the Dielectric Constants of Thin Noble Metallic Films Using a Surface Plasmon Resonance Sensor [O] . Longbiao Tao, Shuo Deng, Hongyun Gao, 2020

机译：表面等离子体共振传感器对贵金属薄膜介电常数的实验研究
7. Selective reflection technique as a probe to monitor the growth of a metallic thin film on dielectric surfaces [O] . Martins, Weliton Soares, Oriá, Marcos, Chevrollier, Martine, 2013

机译：选择性反射技术作为监测a的生长的探针介电表面上的金属薄膜
8. Metal Thin Film Growth on Multimetallic Surfaces: From Quaternary Metallic Glass to Binary Crystal. [R] . Jing, D. 2010

机译：多金属表面金属薄膜的生长：从第四纪金属玻璃到二元晶体。

Selective reflection technique as a probe to monitor the growth of metallic thin film on dielectric surfaces

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