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Simultaneous measurement of phase and local orientation of linearly polarized light: implementation and measurement results

机译：线性偏振光的相位和局部取向的同时测量：实施和测量结果

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摘要

Optical components manipulating both polarization and phase of wave fields find many applications in today's optical systems. With modern lithography methods it is possible to fabricate optical elements with nanostructured surfaces from different materials capable of generating spatially varying, locally linearly polarized-light distributions, tailored to the application in question. Since such elements in general also affect the phase of the light field, the characterization of the function of such elements consists in measuring the phase and the polarization of the generated light, preferably at the same time. Here, we will present first results of an interferometric approach for a simultaneous and spatially resolved measurement of both phase and polarization, as long as the local polarization at any point is linear (e.g., for radially or azimuthally polarized light).
机译：操纵偏振和波场相位的光学组件在当今的光学系统中找到了许多应用。利用现代的光刻方法，可以由不同的材料制造具有纳米结构表面的光学元件，这些材料能够产生空间变化的，局部线性偏振的光分布，以适应所讨论的应用。由于这样的元件通常也影响光场的相位，因此这些元件的功能的表征在于优选地同时测量所产生的光的相位和偏振。在这里，我们将介绍用于相位和偏振的同时和空间分辨测量的干涉测量方法的第一结果，只要在任何一点上的局部偏振都是线性的（例如，对于径向或方位偏振的光）。

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