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Growth of axial SiGe heterostructures in nanowires using pulsed laser deposition

机译:使用脉冲激光沉积法生长纳米线中的轴向SiGe异质结构

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Axial heterojunctions between pure silicon and pure germanium in nanowires have been realized combining pulsed laser deposition, chemical vapor deposition and electron beam evaporation in a vapor-liquid-solid nanowire growth experiment using gold nanoparticles as catalyst for the 1D wire growth. Energy dispersive x-ray mappings and line scans show a compositional transition from pure silicon to pure germanium and vice versa with exponential and thus comparably sharp transition slopes. Based on these results not only Si-Ge heterojunctions seem to be possible using the vapor-liquid-solid growth process but also heterojunctions in optoelectronic III-V compounds such as InGaAs/GaAs or groupIII nitride compounds such as InGaN/GaN as well as axial p-n junctions in Si nanowires
机译:纳米线中纯硅和纯锗之间的轴向异质结已经结合使用金纳米颗粒作为一维线生长催化剂的气液固纳米线生长实验中,结合了脉冲激光沉积,化学气相沉积和电子束蒸发实现。能量色散X射线映射和线扫描显示了从纯硅到纯锗的成分跃迁,反之亦然,并且具有指数级的跃迁斜率。基于这些结果,不仅可以通过气-液-固生长工艺实现Si-Ge异质结,而且在光电III-V族化合物(如InGaAs / GaAs)或III族氮化物(如InGaN / GaN)中也可以实现异质结。 Si纳米线中的pn结

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