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Ordered rippling of polymer surfaces by nanolithography: Influence of scan pattern and boundary effects

机译：纳米平版印刷术对聚合物表面的有序波纹：扫描图案和边界效应的影响

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摘要

We demonstrate how AFM nanolithography, with a proper choice of scan pattern, can induce an exceptionally ordered alignment of ripples on the surface of polymer films on the first scan. By analogy with the manipulation of nanoparticles, the orientation of the ripples is determined by the material flow, which is ultimately fixed by the direction of motion of the probing tip. This makes a raster scan pattern the best choice for orienting the ripples, as opposed to the zigzag scan pattern commonly adopted by most AFM setups. Our hypothesis is substantiated by a series of measurements on a solvent-enriched ultrathin film of PET, which allowed ripple formation on the first scan. We also show how the ripple orientation is significantly modified by the boundary conditions appearing when nanolithography is performed on circular, triangular and L-shaped areas on the polymer surface.
机译：我们展示如何AFM纳米光刻，用扫描图案的适当选择，可以诱​​导在第一次扫描的聚合物膜的表面上的波纹的非常有序对齐。与纳米颗粒的处理类似，波纹的方向由材料流决定，材料流最终由探测头的运动方向固定。与大多数AFM设置通常采用的锯齿形扫描图案相反，这使光栅扫描图案成为确定波纹方向的最佳选择。我们的假设通过对富含溶剂的PET超薄膜进行的一系列测量得到了证实，该测量允许在第一次扫描时形成波纹。我们还显示了当在聚合物表面上的圆形，三角形和L形区域上进行纳米光刻时，如何通过出现的边界条件显着改变波纹取向。

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