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High photosensitivity few-layered MoSe_2 back-gated field-effect phototransistors

机译:高光敏性几层MoSe_2背栅场效应光电晶体管

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In this paper, we report on the fabrication and optoelectronic properties of high sensitive phototransistors based on few-layered MoSe_2 back-gated field-effect transistors, with a mobility of 19.7 cm~2 V~(-1) s~(-1) at room temperature. We obtained an ultrahigh photoresponsivity of 97.1AW~(-1) and an external quantum efficiency (EQE) of 22 666% using 532 nm laser excitation at room temperature. The photoresponsivity was improved near the threshold gate voltage; however, the selection of the silicon dioxide as a gate oxide represents a limiting factor in the ultimate performance. Thanks to their high photoresponsivity and external quantum efficiency, the few-layered MoSe_2-based devices are promising for photoelectronic applications.
机译:本文报道了以迁移率为19.7 cm〜2 V〜(-1)s〜(-1)的几层MoSe_2背栅场效应晶体管为基础的高灵敏光电晶体管的制造和光电性能。在室温下。我们在室温下使用532 nm激光激发,获得了97.1AW〜(-1)的超高光敏度和226.66%的外部量子效率(EQE)。在接近阈值栅极电压时,光响应性得到了改善;然而,选择二氧化硅作为栅氧化物代表了最终性能的限制因素。由于它们的高光响应性和外部量子效率,基于MoSe_2的几层器件有望用于光电应用。

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