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Spatial mapping of focused surface acoustic waves in the investigation of high frequency strain induced changes

机译:聚焦表面声波在高频应变引起的变化研究中的空间作图

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The field of straintronics, in which strain is used to drive phase transitions, ordering and structural changes, has conventionally been limited to dc or low frequency strain. High frequency large strains, which have the potential to serve as a high frequency trigger of strain sensitive physical phenomena, can be generated using focused surface acoustic waves, which produce two dimensional standing strain waves with very high strain at the elliptical focus. Here, the strain standing wave pattern generated by a focused surface acoustic wave is mapped and quantified as a function of voltage and frequency with high spatial resolution. A knife-edge optical reflection method is used to map the strain standing wave pattern generated by a 87.95 MHz annular interdigital transducer on 128 degrees Y-Cut LiNbO3. Subsequent to strain mapping, ferromagnetic Co/Pt multilayers nanostructures are lithographically patterned within the high strain region for preliminary measurements of magnetization changes arising from high frequency fast strain. The knife edge technique is simple, results in excellent spatial resolution and is fully compatible with other optical measurements, such as focused magneto-optic Kerr measurements, while maintaining spatial information. This ability to accurately and reproducibly determine the position of maximum strain and to lock onto a specific strain region is an important step in the investigation of the effects of high frequency strain on thin film materials, which range from magnetic reorientations to strain induced phase transitions.
机译:传统上将应变用于驱动相变,有序化和结构变化的应变电子学领域仅限于直流或低频应变。高频大应变有可能用作应变敏感物理现象的高频触发信号,可以使用聚焦的表面声波产生,该声表面波在椭圆形焦点处产生具有很高应变的二维驻极应变波。在此,由聚焦的表面声波产生的应变驻波图根据空间分辨率高的电压和频率进行映射和量化。使用刀口光学反射方法将由87.95 MHz环形叉指式换能器产生的应变驻波图映射到128度Y形LiNbO3上。在应变映射之后,在高应变区域内对铁磁Co / Pt多层纳米结构进行光刻图案化,以初步测量由高频快速应变引起的磁化强度变化。刀刃技术很简单,具有出色的空间分辨率,并且与其他光学测量(例如聚焦磁光Kerr测量)完全兼容,同时还能保持空间信息。准确而可重复地确定最大应变位置并锁定在特定应变区域上的能力是研究高频应变对薄膜材料影响的重要步骤,高频应变对薄膜材料的影响从磁取向到应变诱导的相变不等。

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