Field-induced doping-mediated tunability in work function of Al-doped ZnO: Kelvin probe force microscopy and first-principle theory

Kumar Mohit; Mookerjee Sumit; Som Tapobrata

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Field-induced doping-mediated tunability in work function of Al-doped ZnO: Kelvin probe force microscopy and first-principle theory

机译：铝掺杂ZnO的功函中场致掺杂介导的可调性：开尔文探针力显微镜和第一性原理

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We demonstrate that the work function of Al-doped ZnO (AZO) can be tuned externally by applying an electric field. Our experimental investigations using Kelvin probe force microscopy show that by applying a positive or negative tip bias, the work function of AZO film can be enhanced or reduced, which corroborates well with the observed charge transport using conductive atomic force microscopy. These findings are further confirmed by calculations based on first-principles theory. Tuning the work function of AZO by applying an external electric field is not only important to control the charge transport across it, but also to design an Ohmic contact for advanced functional devices.

机译：我们证明，可以通过施加电场从外部调整掺铝的ZnO（AZO）的功函数。我们使用开尔文探针力显微镜的实验研究表明，通过施加正或负尖端偏压，可以增强或降低AZO膜的功函数，这与使用导电原子力显微镜观察到的电荷传输有很好的证实。这些发现被基于第一原理理论的计算进一步证实。通过施加外部电场来调节AZO的功函数不仅对于控制其上的电荷传输非常重要，而且对于设计高级功能器件的欧姆接触也很重要。

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《Nanotechnology》 |2016年第37期|共11页
作者
Kumar Mohit; Mookerjee Sumit; Som Tapobrata;
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Kelvin probe force microscopy; conductive atomic force microscopy; work function; first-principle theory;

机译：开尔文探针力显微镜;导电原子力显微镜;功函数;第一性原理;

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1. Field-induced doping-mediated tunability in work function of Al-doped ZnO: Kelvin probe force microscopy and first-principle theory [J] . Kumar Mohit, Mookerjee Sumit, Som Tapobrata Nanotechnology . 2016,第37期

机译：铝掺杂ZnO的功函中场致掺杂介导的可调性：开尔文探针力显微镜和第一性原理
2. Variations in the work function of doped single- and few-layer graphene assessed by Kelvin probe force microscopy and density functional theory [J] . D. Ziegler, P. Gava, J. Guettinger, Physical review . 2011,第23期

机译：用开尔文探针力显微镜和密度泛函理论评估掺杂的单层和多层石墨烯的功函变化
3. Unraveling nanoscale conduction and work function in a poly(3,4-ethylenedioxypyrrole)/carbon nanotube composite by Kelvin probe force microscopy and conducting atomic force microscopy [J] . B. Narsimha Reddy, Melepurath Deepa Electrochimica Acta . 2012,第Null期

机译：开尔文探针力显微镜和导电原子力显微镜揭示聚（3,4-乙撑二氧基吡咯）/碳纳米管复合材料中的纳米级导电和功函数
4. nm-scaled workfunction mapping of the interfaces of silicon heterojunction (SHJ) solar cell using Kelvin probe force microscopy [C] . Yamada Fumihiko, Kamioka Takefumi, Tachibana Tomihisa, IEEE Photovoltaic Specialists Conference . 2014

机译：使用开尔文探针力显微镜对硅异质结（SHJ）太阳能电池的界面进行纳米级功函数映射
5. Fundamentals of Kelvin Probe Force Microscopy and its Applications in the Characterization of Solar Cells [D] . Lan, Fei. 2017

机译：开尔文探头力显微镜的基础及其在太阳能电池特征中的应用
6. Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation [O] . Dominik Wrana, Karol Cieślik, Wojciech Belza, 2019

机译：开尔文探针力显微镜功函数在过渡还原和氧化作用下表征过渡金属氧化物晶体
7. Variations in the work function of doped single- and few-layer graphene assessed by Kelvin probe force microscopy and density functional theory [O] . Ziegler, D., Gava, P., Güttinger, J., 2011

机译：用开尔文探针力显微镜和密度泛函理论评估掺杂的单层和多层石墨烯的功函变化

Field-induced doping-mediated tunability in work function of Al-doped ZnO: Kelvin probe force microscopy and first-principle theory

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