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Positron annihilation spectroscopy: a new frontier for understanding nanoparticle-loaded polymer brushes

机译:正电子an没光谱:了解纳米粒子负载聚合物刷的新领域

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Nanoparticle-loaded polymer brushes are powerful tools for the development of innovative devices. However, their characterization is challenging and arrays of different techniques are typically required to gain sufficient insight. Here we demonstrate for the first time the suitability of positron annihilation spectroscopy (PAS) to investigate, with unprecedented detail and without making the least damage to samples, the physico-chemical changes experienced by pH-responsive polymer brushes after protonation and after loading of silver nanoparticles. One of the most important findings is the depth profiling of silver nanoparticles inside the brushes. These results open up a completely new way to understand the structure and behavior of such complex systems.
机译:纳米颗粒聚合物刷是开发创新设备的强大工具。但是,它们的表征具有挑战性,通常需要使用各种不同的技术来获得足够的洞察力。在这里,我们首次展示了正电子an没光谱法(PAS)的适用性,它以前所未有的细节进行了研究,并且对样品的损害最小,而且对质子化后和装载银后pH响应聚合物刷的物理化学变化没有影响。纳米粒子。最重要的发现之一是刷子内部银纳米颗粒的深度剖析。这些结果为理解这种复杂系统的结构和行为开辟了一种全新的方式。

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