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A rapid and automated relocation method of an AFM probe for high-resolution imaging

机译：一种快速自动重定位AFM探头以进行高分辨率成像的方法

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摘要

The atomic force microscope (AFM) is one of the most powerful tools for high-resolution imaging and high-precision positioning for nanomanipulation. The selection of the scanning area of the AFM depends on the use of the optical microscope. However, the resolution of an optical microscope is generally no larger than 200 nm owing to wavelength limitations of visible light. Taking into consideration the two determinants of relocation-relative angular rotation and positional offset between the AFM probe and nano target-it is therefore extremely challenging to precisely relocate the AFM probe to the initial scan/manipulation area for the same nano target after the AFM probe has been replaced, or after the sample has been moved. In this paper, we investigate a rapid automated relocation method for the nano target of an AFM using a coordinate transformation. The relocation process is both simple and rapid; moreover, multiple nano targets can be relocated by only identifying a pair of reference points. It possesses a centimeter-scale location range and nano-scale precision. The main advantages of this method are that it overcomes the limitations associated with the resolution of optical microscopes, and that it is label-free on the target areas, which means that it does not require the use of special artificial markers on the target sample areas. Relocation experiments using nanospheres, DNA, SWCNTs, and nano patterns amply demonstrate the practicality and efficiency of the proposed method, which provides technical support for mass nanomanipulation and detection based on AFM for multiple nano targets that are widely distributed in a large area.
机译：原子力显微镜（AFM）是用于纳米成像的高分辨率成像和高精度定位的最强大工具之一。 AFM扫描区域的选择取决于光学显微镜的使用。然而，由于可见光的波长限制，光学显微镜的分辨率通常不大于200nm。考虑到AFM探针和纳米靶之间的相对位置相对角旋转和位置偏移这两个决定因素-因此，在AFM探针之后，将AFM探针精确地重新定位到同一纳米靶的初始扫描/操纵区域非常困难。已被更换，或样品被移动后。在本文中，我们研究了使用坐标变换的AFM纳米靶标的快速自动重定位方法。搬迁过程既简单又迅速;此外，仅识别一对参考点就可以重新定位多个纳米目标。它具有厘米级的位置范围和纳米级的精度。该方法的主要优点是它克服了与光学显微镜分辨率相关的限制，并且在目标区域没有标签，这意味着它不需要在目标样品区域使用特殊的人工标记。使用纳米球，DNA，SWCNT和纳米图案进行的重定位实验充分证明了该方法的实用性和有效性，为基于AFM的质量纳米操作和检测提供了技术支持，该方法适用于在大范围内广泛分布的多个纳米目标。

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