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Zernike x-ray ptychography

机译:Zernike X射线指纹图谱

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摘要

We present an imaging technique combining Zernike phase-contrast imaging and ptychography. The contrast formation is explained by following the theory of Zernike phase-contrast imaging. The method is demonstrated with x-rays at a photon energy of 6.2 keV, showing how ptychographic reconstruction of a phase sample leads to a Zernike phase-contrast image appearing in the amplitude reconstruction. In addition, the results presented in this Letter indicate an improvement of the resolution of the reconstructed object in the case of Zernike ptychography compared with the conventional one. (C) 2016 Optical Society of America
机译:我们提出一种成像技术,结合了Zernike相衬成像和tytychography。遵循Zernike相衬成像理论来解释对比度的形成。用6.2 keV的光子能量的X射线演示了该方法,该方法显示了相位样本的笔录重建如何导致Zernike相衬图像出现在幅度重建中。此外,在这封信中提出的结果表明,与传统方法相比,在Zernike指纹图谱技术中,重建对象的分辨率有所提高。 (C)2016美国眼镜学会

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