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首页> 外文期刊>Optics Letters >Transverse and longitudinal characterization of electron beams using interaction with optical near-fields
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Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

机译：利用与光学近场的相互作用对电子束进行横向和纵向表征

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摘要

We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America
机译：我们演示了束状飞秒自由电子束的横向和纵向表征的实验技术。该工作原理基于对电子电流的监视，该电子在与飞秒激光脉冲激发的同步光学近场波相互作用期间获得能量增益。局限在硅纳米结构表面的同步加速/减速场是使用高度聚焦的亚相对论电子束表征的。这里展示了该技术可实现的450 nm的横向空间分辨率和480 fs的飞秒时间分辨率（简要讨论了亚光学周期的时间范围）。 （C）2016美国眼镜学会

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