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首页> 外文期刊>Physica, B. Condensed Matter >Optical properties of selenium-tellurium nanostructured thin film grown by thermal evaporation
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Optical properties of selenium-tellurium nanostructured thin film grown by thermal evaporation

机译：热蒸发生长硒-硒纳米结构薄膜的光学性质

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摘要

Se-Te nanostructured thin films were deposited on glass substrates in the presence of oxygen and argon by thermal evaporation. The properties of Se-Te thin films strongly depend on the deposition method. During the process used, the substrate is cooled to a temperature of 77 K employing liquid nitrogen. The nanostructured thin films of Se100-xTex (where x = 4, 8 and 16) are deposited on glass substrate. The surface morphology of the deposited films was investigated through Scanning Electron Microscopy (SEM). The typical size of these narrostructures is in the range 40-100 nm and the length is of the order of several micrometers. The optical parameters i.e. optical gap (E,), absorption coefficient (a), and extinction coefficient (k) are calculated in the wavelength range 190-1100nm. It was found that the optical band gap decreased from 3.4 to 2.9 eV when Te concentration was increased in the Se100-xTex nanostructured thin films. The large bandgap may be attributed to the decrease in particle size which clearly exhibits a quantum size effect. XRD analysis was performed to confirm glassy nature of the nanostructured thin films.
机译：通过氧气的热蒸发，在氧气和氩气的存在下，将Se-Te纳米结构薄膜沉积在玻璃基板上。 Se-Te薄膜的性能在很大程度上取决于沉积方法。在使用的过程中，使用液氮将基板冷却至77 K的温度。 Se100-xTex（其中x = 4、8和16）的纳米结构薄膜沉积在玻璃基板上。通过扫描电子显微镜（SEM）研究沉积膜的表面形态。这些narrostructures的典型大小是在40-100 nm范围内，并且长度约为几微米。在1900-1100nm的波长范围内计算光学参数，即光学间隙（E 1），吸收系数（a）和消光系数（k）。发现当Se100-xTex纳米结构薄膜中的Te浓度增加时，光学带隙从3.4eV降低到2.9eV。带隙大可归因于粒径的减小，这明显表现出量子尺寸效应。进行XRD分析以确认纳米结构薄膜的玻璃质性质。

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