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首页> 外文期刊>Physica, B. Condensed Matter >Electrical current influence on resistance and localization length of a Co-Al2O3 granular thin film
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Electrical current influence on resistance and localization length of a Co-Al2O3 granular thin film

机译:电流对Co-Al2O3颗粒薄膜的电阻和局部化长度的影响

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摘要

Electrical, magnetic and magnetotransport properties were measured in a Co-Al_2O_3 granular film. Electrical resistance was obtained in the low-field regime (e δV < k_BT) under variation of injected current and bias and as a function of temperature and bias. Electrical properties were best described with the model of variable range hopping, where the electrical resistance decreases and the electronic localization length increases with increase of the applied bias and/or current. We associate this behavior to the activation of new electronic paths between more distant grains, reducing the total resistance whilst additional parallel paths are formed. This behavior is similar to results obtained with Fe-Al_2O_3 granular thin films, which however have a higher range of resistance variation.
机译:在Co-Al_2O_3颗粒膜中测量电,磁和磁传输性质。在注入电流和偏置的变化以及温度和偏置的函数下,在低场条件下获得电阻(eδV

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