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首页> 外文期刊>Physica, B. Condensed Matter >Some recent results using spin echo resolved grazing incidence scattering (SERGIS)
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Some recent results using spin echo resolved grazing incidence scattering (SERGIS)

机译：最近的一些使用自旋回波分辨掠入射散射（SERGIS）的结果

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The advantages of neutrons for probing bulk structures are well known: they provide statistically averaged correlation functions over a large range of length scales and they are sensitive to light atoms such as hydrogen. These same qualities are, in principle, useful in the study of surfaces and buried morphologies in thin films, especially when the films are polymeric or biological. However, because of the limited sample volume for such systems, the scattering is weak, especially if the neutron beam has to be severely collimated in order to resolve distances of interest (typically 10 to several 100 nm parallel to the surface of the sample). SERGIS is a technique that can potentially overcome these limitations by allowing high resolution measurements of lateral surface structure without requiring tight beam collimation. In this paper we discuss recent progress towards implementing SERGIS both at the Low Energy Neutron Source at Indiana University and on the Asterix reflectometer at the Los Alamos Neutron Science Center (LANSCE). The architecture we use exploits a robust symmetry-related cancellation of Larmor phase aberrations. The spatial resolution it achieves closely mimics that of the ideal magnetic Wollaston prisms. To make progress in understanding SERGIS, we have applied it to the measurement of simple diffraction gratings and developed a dynamical theory that accounts quantitatively and without adjustable parameters for all of the data sets we have measured to date. We argue here that, if SERGIS is to be applied to the study of weakly scattering thin films, it will be necessary to develop the technique of dark-field spin echo scattering angle measurement.
机译：中子探测本体结构的优势是众所周知的：它们在很大的长度范围内提供统计平均的相关函数，并且对轻原子（例如氢）敏感。原则上，这些相同的性质可用于研究薄膜的表面和掩埋形态，特别是当薄膜是聚合物或生物薄膜时。但是，由于此类系统的样品量有限，因此散射较弱，尤其是在必须严格准直中子束以分辨感兴趣距离（通常平行于样品表面10到100 nm）的情况下。 SERGIS是一种可以通过对横向表面结构进行高分辨率测量而无需严格的光束准直的技术，有可能克服这些限制。在本文中，我们将讨论印第安纳大学低能中子源和洛斯阿拉莫斯中子科学中心（LANSCE）在Asterix反射仪上实施SERGIS的最新进展。我们使用的架构利用了与拉莫尔相位像差有关的强大的对称性抵消。它所达到的空间分辨率与理想的沃拉斯顿磁性棱镜的分辨率非常相似。为了在理解SERGIS方面取得进展，我们将其应用于简单衍射光栅的测量，并开发了一种动力学理论，该理论定量地说明了迄今为止测量的所有数据集，而没有可调参数。在这里，我们认为，如果将SERGIS用于薄弱散射薄膜的研究，则有必要发展暗场自旋回波散射角测量技术。

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