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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Crystallinity-Controlled Synthesis of Zirconium Oxide Thin Films on Nitrogen-Doped Carbon Nanotubes by Atomic Layer Deposition
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Crystallinity-Controlled Synthesis of Zirconium Oxide Thin Films on Nitrogen-Doped Carbon Nanotubes by Atomic Layer Deposition

机译:原子层沉积在氮掺杂碳纳米管上结晶度控制的氧化锆薄膜的合成

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摘要

Zirconium oxide (ZrO2) thin film was deposited on nitrogen-doped carbon nanotubes (NCNTs) by atomic layer deposition (ALD) using tetrakis-(dimethylamido) zirconium (rv) and water as precursors. The observation using scanning electron microscope and transmission electron microscope (TEM) revealed that the tubular films of 100-cycle ZrO2 were very uniform and conformal on NCNTs. Further characterization using X-ray diffraction, Raman spectroscopy, selected area electron diffraction, and high-resolution TEM disclosed that the crystallinity of the deposited ZrO2 films was controllable with deposition temperatures in the range of 100-250 °C. In contrast to the pure amorphous ZrO2 film deposited at 100 °C, tetragonal crystalline ZrO2 film was prepared at 250 °C, while a mixture of the former two phases was found between 150 and 200 °C. In all cases, the growth of ZrO2 tubular films on NCNTs showed a transformation from an island-growth mode to a iayer-by-layer growth mode with increasing ALD cycles. The ZrO2-NCNT nanocomposites with controllable crystallinity will have great potential for various applications in fuel cells, batteries, electronics devices, and chemical sensors.
机译:以四-(二甲基氨基)锆(rv)和水为前驱体,通过原子层沉积(ALD)将氧化锆(ZrO2)薄膜沉积在氮掺杂的碳纳米管(NCNT)上。使用扫描电子显微镜和透射电子显微镜(TEM)进行的观察表明,100循环ZrO2的管状薄膜非常均匀且在NCNT上是共形的。使用X射线衍射,拉曼光谱,选定区域电子衍射和高分辨率TEM进行的进一步表征表明,沉积的ZrO2薄膜的结晶度可在100-250°C的范围内控制。与在100°C下沉积的纯非晶ZrO2膜相反,在250°C下制备了四方晶态ZrO2膜,而发现前两相的混合物在150至200°C之间。在所有情况下,随着ALD循环的增加,NrCNTs上ZrO2管状薄膜的生长显示出从岛生长模式到逐层生长模式的转变。具有可控制结晶度的ZrO2-NCNT纳米复合材料将在燃料电池,电池,电子设备和化学传感器的各种应用中具有巨大的潜力。

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