• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Journal of Applied Polymer Science >Electron holography and AFM studies on styrenic block copolymers and a high impact polystyrene
【24h】

Electron holography and AFM studies on styrenic block copolymers and a high impact polystyrene

机译：苯乙烯嵌段共聚物和高抗冲聚苯乙烯的电子全息和AFM研究

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Many of the artifacts of conventional electron microscopy can be avoided if the unstained polymers are studied by electron holography and atomic force microscopy (AFM). Holograms of thin sections (50-70 nm) of organic block copolymers were recorded, and the corresponding phase images were reconstructed. In this way, typical structures such as lamellae and cylinders could be imaged without any staining. In addition, we successfully recorded holograms and performed Lorentz microscopy of an impact-modified polystyrene (high-impact polystyrene). The results were compared with the tapping mode AFM phase images. Electron holography and AFM have been demonstrated as suitable tools to image unstained heterogeneous polymers, leading to the understanding of their structure. (c) 2005 Wiley Periodicals, Inc.
机译：如果通过电子全息和原子力显微镜（AFM）研究未染色的聚合物，则可以避免传统电子显微镜的许多伪影。记录有机嵌段共聚物的薄截面（50-70 nm）的全息图，并重建相应的相图像。这样，可以对典型的结构（如薄片和圆柱体）进行成像而不会造成任何染色。此外，我们成功地记录了全息图，并对抗冲改性的聚苯乙烯（高抗冲聚苯乙烯）进行了Lorentz显微镜检查。将结果与敲击模式AFM相位图像进行比较。电子全息和原子力显微镜已被证明是对未染色的异质聚合物成像的合适工具，从而使人们对其结构有了更深入的了解。 （c）2005年Wiley Periodicals，Inc.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号