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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >High hole mobility GeSn on insulator formed by self-organized seeding lateral growth
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High hole mobility GeSn on insulator formed by self-organized seeding lateral growth

机译:自组织种子横向生长形成的绝缘体上的高空穴迁移率GeSn

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摘要

Tensile strained single-crystal GeSn on insulator (GSOI) was obtained using self-organized seeding lateral growth. Segregation of Sn atoms and Sn distribution occurred during the lateral growth of the GeSn stripe. At both edges of the GSOI, Sn concentration distribution was found in good agreement with calculation based on the Scheil equation. P-channel metal-oxide-semiconductor field effect transistors were fabricated using the GSOI materials. Good transistor performance with the low field peak hole mobility of 383 cm(2) V-1 s(-1) was obtained, which indicated the high quality of this GSOI structure.
机译:使用自组织种子横向生长获得绝缘体上的拉伸应变单晶GeSn(GSOI)。在GeSn条纹的横向生长过程中,发生了Sn原子的偏析和Sn的分布。在GSOI的两个边缘,发现Sn浓度分布与基于Scheil方程的计算非常吻合。使用GSOI材料制造了P沟道金属氧化物半导体场效应晶体管。获得了良好的晶体管性能以及383 cm(2)V-1 s(-1)的低场峰值空穴迁移率,这表明该GSOI结构的高质量。

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