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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Nanoscale contact resistance of V2O5 xerogel films developed by nanostructured powder
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Nanoscale contact resistance of V2O5 xerogel films developed by nanostructured powder

机译：纳米粉末制备的V2O5干凝胶薄膜的纳米接触电阻

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摘要

Here we report the synthesis of V2O5 nanostructures by a fast, simple, cost-effective, low-temperature chemical process; followed by the deposition of V2O5 xerogel thin films on a glass substrate by a sol-gel route. Phase analysis, phase transition, microstructural and electronic characterization studies are carried out by x-ray diffraction, texture coefficient analysis, field emission scanning electron microscopy, transmission electron microscopy (TEM), related selected area electron diffraction pattern (SAED) analysis, Fourier transform infrared spectroscopy, thermogravimetry and differential thermal analysis, differential scanning calorimetry, and x-ray photoelectron spectroscopy techniques. Confirmatory TEM and SAED data analysis prove further that in this polycrystalline powder there is a unique localized existence of purely single crystalline V2O5 powder with a preferred orientation in the (0 1 0) direction. The most interesting result obtained in the present work is that the xerogel thin films exhibit an inherent capability to enhance the intrinsic resistance against contact induced deformations as more external load is applied during the nanoindentation experiments. In addition, both the nanohardness and Young's modulus of the films are found to be insensitive to load variations (e.g. 1 to 7 mN). These results are explained in terms of microstructural parameters, e.g. porosity and structural configuration.
机译：在这里，我们报告了通过快速，简单，经济高效的低温化学过程合成V2O5纳米结构的过程。然后通过溶胶-凝胶法将V2O5干凝胶薄膜沉积在玻璃基板上。通过X射线衍射，织构系数分析，场发射扫描电子显微镜，透射电子显微镜（TEM），相关选定区域电子衍射图谱（SAED）分析，傅里叶变换进行相分析，相变，微结构和电子表征研究红外光谱，热重分析和差热分析，差示扫描量热法和X射线光电子能谱技术。验证性TEM和SAED数据分析进一步证明，在该多晶粉末中，存在唯一局部存在的纯单晶V2O5粉末，其在（0 1 0）方向上具有较好的取向。在本工作中获得的最有趣的结果是，在纳米压痕实验过程中，随着施加更多的外部载荷，干凝胶薄膜表现出一种固有的能力，可以增强抵抗接触引起的形变的内在抵抗力。另外，发现膜的纳米硬度和杨氏模量均对负载变化（例如1至7mN）不敏感。这些结果用微观结构参数来解释，例如。孔隙率和结构构造。

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