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首页> 外文期刊>Nanotechnology >High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy
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High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy

机译：开环边带频率调制开环探头力显微镜中振幅和频率的高速数字化

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摘要

A more inclusive and detailed measurement of various physical interactions is enabled by the advance of high-speed data digitization. For surface potential characterization, this was demonstrated recently in terms of open-loop amplitude modulation Kelvin probe force microscopy (OL AM-KPFM). Its counterpart, namely open-loop frequency modulation Kelvin probe force microscopy (OL FM-KPFM), is examined here across different materials and under various bias voltages in the form of OL sideband FM-KPFM. In this implementation the changes in the amplitude and resonance frequency of the cantilever were continuously tracked as a conductive AFM probe was modulated by a 2 kHz AC bias voltage around the first eigenmode frequency of the cantilever. The contact potential difference (CPD) between the AFM probe and sample was determined from the time series analysis of the high-speed 4 MHz digitized amplitude and frequency signals of the OL sideband FM-KPFM mode. This interpretation is demonstrated to be superior to the analysis of the parabolic bias dependent response, which is more commonly used to extract the CPD in OL KPFM modes. The measured OL sideband FM-KPFM amplitude and frequency responses are directly related to the electrostatic force and force-gradient between the AFM probe and sample, respectively. As a result, clear distinction was observed for the determined CPD in each of these cases across materials of different surface potentials, with far superior spatial resolution when the force-gradient detection was used. In addition, the CPD values obtained from OL sideband FM-KPFM amplitude and frequency measurements perfectly matched those determined from their closed-loop AM-KPFM and FM-KPFM counterparts, respectively.
机译：通过高速数据数字化的进展使得能够更具更多包容性和详细的各种物理交互测量。对于表面电位表征，最近在开环振幅调制kelvin探针力显微镜（OL AM-KPFM）方面证明了这一点。其对应物，即开环频率调制kelvin探针力显微镜（OL FM-KPFM），在此跨不同的材料检查，并在OL边带FM-KPFM形式的各种偏置电压下进行检查。在该实现中，连续跟踪悬臂的幅度和谐振频率的变化作为导电AFM探针通过悬臂的第一特征频率围绕的2kHz AC偏置电压进行调制。根据OL边带FM-KPFM模式的高速4 MHz数字幅度和频率信号的时间序列分析确定AFM探针和样品之间的接触电位差（CPD）。该解释被证明优于对抛物线偏置依赖性响应的分析，这更常用于提取OL KPFM模式中的CPD。测得的OL边带FM-KPFM幅度和频率响应分别与AFM探针和样品之间的静电力和力梯度直接相关。结果，在不同表面电位的材料中，在这些情况下，在各种情况下测定的CPD，观察到明确的区别，当使用力梯度检测时，在不同的表面电位的材料中的每种情况下都具有较高的空间分辨率。另外，从OL边带FM-KPFM幅度和频率测量获得的CPD值分别与其闭环AM-KPFM和FM-KPFM对应物中确定的那些完全匹配。

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