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Gate-tunable strong-weak localization transition in few-layer black phosphorus

机译:在几层黑色磷中的栅极可调强弱的定位过渡

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摘要

Atomically-thin black phosphorus (BP) field-effect transistors show strong-weak localization transition, which is tunable through gate voltages. Hopping transports through charge impurityinduced localized states are observed at low carrier density regime. Variable-range hopping model is applied to simulate scattering behaviors of charge carriers. In the high carrier concentration regime, a negative magnetoresistance indicates weak localization effects. The extracted phase coherence length is power-law temperature-dependent (similar to T-0.48 +/- 0.03) and demonstrates inelastic electron-electron interactions and the 2D transport features in few-layer BP field-effect devices. The competition between localization and phase coherence lengths is investigated and analyzed based on observed gate-tunable strong-weak localization transition in few-layer BP.
机译:原子薄的黑色磷(BP)场效应晶体管显示出强弱的定位转换,其通过栅极电压可调。 在低载波密度方案中观察到跳跃通过电荷诱导局部状态。 应用可变范围跳跃模型来模拟电荷载波的散射行为。 在高载流子浓度方案中,负磁阻表明定位效应弱。 提取的相干长度是动力法温度依赖性的(类似于T-0.48 +/- 0.03),并在几层BP场效应装置中说明无弹性电子相互作用和2D传输特征。 基于观察到的栅极可调强弱弱定位转换,研究了本地化和相干长度之间的竞争,并在几层BP中进行了分析。

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