• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Nanotechnology >In situ observation of the formation process for free-standing Au nanowires with a scanning electron microscope
【24h】

In situ observation of the formation process for free-standing Au nanowires with a scanning electron microscope

机译：以扫描电子显微镜对固定Au纳米线的形成过程的原位观察

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

We have developed a simultaneous electronic and structural characterization method for studying the formation process for Au nanowires. The method is based on two-probe electronic transport measurement of free-standing Au nanowires and simultaneous structural characterization using scanning electron microscopy (SEM). We measured the electronic currents during the electromigration (EM)-induced narrowing process for the free-standing Au nanowires. A free-standing Au nanowire with a desired conductance value was fabricated by EM. Simultaneous SEM and conductance measurements revealed the EM-induced narrowing process for the Au wires, in which material transfer in the nanowires caused growth towards the positively biased electrode and contact failure at the negatively biased electrode. The narrowed free-standing Au nanowires were stable and could be maintained for more than 10 h without their conductance changing. These results indicate the high stability of the EM-processed Au nanowires compared to Au nanowires fabricated by mechanical elongation or the breaking of Au nanocontacts.
机译：我们开发了一种同时的电子和结构表征方法，用于研究Au纳米线的形成过程。该方法基于双防立式Au纳米线和使用扫描电子显微镜（SEM）的同时结构表征的两探针电子传输测量。我们在电迁移（EM） - 诱导的自由静态Au纳米线的变窄过程中测量了电子电流。 EM制造具有所需电导值的独立Au纳米线。同时SEM和电导测量揭示了Au线的EM诱导的变窄过程，其中纳米线中的材料传递引起朝向正偏置电极的生长，并在负偏置电极处接触失效。狭窄的独立式Au纳米线稳定，可以保持超过10小时，没有它们的电导变化。这些结果表明EM处理的Au纳米线的高稳定性与通过机械伸长率制造的Au纳米线或Au纳米接触的破裂的纳米线相比。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号