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Measuring individual carbon nanotubes and single graphene sheets using atomic force microscope infrared spectroscopy

机译:使用原子力显微镜红外光谱法测量单个碳纳米管和单石墨烯片

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摘要

Atomic force microscope infrared spectroscopy (AFM-IR) combines the spatial resolution of AFM with the chemical specificity of IR spectroscopy. In AFM-IR, sample absorption of pulsed IR light causes rapid thermomechanical expansion, which excites resonance in an AFM cantilever in contact with the sample. The cantilever resonant amplitude is proportional to the local sample IR absorption coefficient. It is difficult to detect thermomechanical expansion in the smallest samples such as 1D and 2D nanomaterials. In this work, we overcome this limitation and use AFM-IR to measure nanometer-scale IR absorption in individual single walled carbon nanotubes and monolayer graphene. By placing a thin layer of polymer beneath the sample, the AFM-IR signal may be increased by up to two orders of magnitude. The polymer beneath the sample thermally insulates the sample and amplifies thermomechanical expansion. Finite element simulations agree with the measurements and provide a general framework for applying this approach to arbitrary samples, including other 1D and 2D materials and thin biological samples.
机译:原子力显微镜红外光谱(AFM-IR)将AFM的空间分辨率与IR光谱的化学特异性相结合。在AFM-IR中,脉冲IR光的样品吸收导致快速的热机械膨胀,这激发了与样品接触的AFM悬臂中的共振。悬臂共振幅度与局部样品红外吸收系数成比例。难以检测最小样品的热机械膨胀,例如1D和2D纳米材料。在这项工作中,我们克服了这种限制,并使用AFM-IR测量单个壁碳纳米管和单层石墨烯中的纳米级IR吸收。通过在样品下方放置薄的聚合物层,AFM-IR信号可以增加到最多两个数量级。样品下方的聚合物热绝缘样品并放大热机械膨胀。有限元模拟与测量结果一致,并提供一种将这种方法应用于任意样品的一般框架,包括其他1D和2D材料和薄的生物样品。

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