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首页> 外文期刊>Nanotechnology >Probing of free and localized excitons and trions in atomically thin WSe2, WS2, MoSe2 and MoS2 in photoluminescence and reflectivity experiments
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Probing of free and localized excitons and trions in atomically thin WSe2, WS2, MoSe2 and MoS2 in photoluminescence and reflectivity experiments

机译：在光致发光和反射率实验中的原子薄WSE2，WS2，MOSE2和MOS2中的自由和局部激子和细菌探测

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We report on detailed temperature dependent (T = 7-295 K) optical spectroscopy studies of WSe2, WS2, MoSe2 and MoS2 monolayers exfoliated onto the same SiO2/Si substrate. In the high energy region of absorption type (reflectivity contrast-RC) and emission (photo-luminescence-PL) spectra of all the monolayers resonances related to the neutral and charged excitons (X and T) are detected in the entire measured temperature range. The optical amplitudes of excitons and trions strongly depend on the temperature and two dimensional carrier gas (2DCG) concentration. In the low energy PL spectra of WSe2 andWS(2) we detect a group of lines (L) which dominates the spectra at low temperatures but rapidly quenches with the increase in the temperature. Interestingly, in the same energy range of the RC spectra recorded for WS2, we observe an additional line (L-0), which behaves in the same way as the L lines in the PL spectra. The optical amplitude of L-0 and T resonances in the RC spectra strongly increases with the growth of the 2DCG concentration. On the base of these observations we identify the L-0 resonance in the RC spectra as arising from the fine structure of the trion. We also propose that the line interpreted previously in PL spectra ofWSe(2) and WS2 as related to the biexciton emission is a superposition of the biexciton, trion and localized exciton emission. We find that with the temperature increase from 7-295 K the total PL intensity decreases moderately in WSe2 and WS2, strongly in MoS2 and dramatically in MoSe2.
机译：我们报告了WSE2，WS2，MOSE2和MOS2单层的详细温度依赖性（T = 7-295 k）光谱研究，剥离到相同的SiO 2 / Si衬底上。在整个测量的温度范围内检测到与中性和带电的激子（X和T）相关的所有单层共振的吸收型（反射率对比RC）和发射（光 - 亮度-PL）光谱中的辐射型和发射激子和枝的光学幅度强烈取决于温度和二维载气（2dcg）浓度。在WSE2和WS（2）的低能量PL光谱中，我们检测一组线（L），其在低温下占据光谱，但随着温度的增加而迅速地淬火。有趣的是，在为WS2记录的RC光谱的相同能量范围中，我们观察到附加线（L-0），其行业方式与PL光谱中的L线相同。随着2DCG浓度的生长，RC光谱中L-0和T共振的光幅度强烈增加。在这些观察结果的基础上，我们将RC光谱中的L-0谐振识别为来自TRION的细结构而产生的RC光谱。我们还提出以前在PL光谱中解释的线在WSWSE（2）和WS2中，与Biexciton发射相关的是Biexciton，Trion和局部激子发射的叠加。我们发现，随着7-295 k的温度增加，总P1强度在WSE2和WS2中适度地减少，在MOS2中强烈地且在MOSE2中显着地降低。

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