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Bridged oxide nanowire device fabrication using single step metal catalyst free thermal evaporation

机译:桥接氧化物纳米线器件使用单步金属催化剂免热蒸发制备

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摘要

In this study, indium-tin-zinc-oxide (ITZO) and Zn doped In2O3 nanowires were directly grown as bridged nanowires between two heavily doped silicon (Si) electrodes on an SOI wafer using single step vapor-solid-solid (VSS) growth method. SEM analysis showed highly dense and self aligned nanowire formation between the Si electrodes. Electrical and UV response measurements were performed in ambient condition. Current-voltage characteristics of devices exhibited both linear and non-linear behavior. This was the first demonstration of bridged ITZO and Zn-doped In2O3 nanowires. Our results show that bridged nanowire growth technique can be a potential candidate for high performance electronic and optoelectronic devices.
机译:在该研究中,铟 - 锡 - 氧化锌(ITZO)和Zn掺杂In2O3纳米线在Soi蒸气固体固体(VSS)生长的两个重掺杂硅(Si)电极上直接生长为桥接纳米线 方法。 SEM分析显示Si电极之间的高度密度和自对准的纳米线形成。 在环境条件下进行电气和UV响应测量。 器件的电流电压特性显示出线性和非线性行为。 这是桥接ITZO和Zn掺杂In2O3纳米线的第一次演示。 我们的结果表明,桥接纳米线生长技术可以是高性能电子和光电器件的潜在候选者。

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  • 来源
    《RSC Advances》 |2018年第19期|共8页
  • 作者单位

    Istanbul Medeniyet Univ Dept Engn Phys Fac Engn &

    Nat Sci TR-34700 Istanbul Turkey;

    Univ Calif Davis Dept Elect &

    Comp Engn 2064 Kemper Hall Davis CA 95616 USA;

    Marmara Univ Dept Phys TR-34722 Istanbul Turkey;

    Yildiz Tech Univ Dept Phys TR-34220 Istanbul Turkey;

    Univ Calif Davis Dept Elect &

    Comp Engn 2064 Kemper Hall Davis CA 95616 USA;

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  • 正文语种 eng
  • 中图分类 化学;
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