Coma aberrations in combined two- and three-dimensional STED nanoscopy

Antonello Jacopo; Kromann Emil B.; Burke Daniel; Bewersdorf Joerg; Booth Martin J.

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Coma aberrations in combined two- and three-dimensional STED nanoscopy

机译：组合两维和三维纤维纳米镜中的昏迷

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Stimulated emission depletion (STED) microscopes, like all super-resolution methods, are sensitive to aberrations. Of particular importance are aberrations that affect the quality of the depletion focus, which requires a point of near-zero intensity surrounded by strong illumination. We present analysis, modeling, and experimental measurements that show the effects of coma aberrations on depletion patterns of two-dimensional (2D) and three-dimensional (3D) STED configurations. Specifically, we find that identical coma aberrations create focal shifts in opposite directions in 2D and 3D STED. This phenomenon could affect the precision of microscopic measurements and has ramifications for the efficacy of combined 2D/3D STED systems. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.

机译：刺激的发射耗尽（STED）显微镜，如所有超分辨率方法，对像差敏感。特别重要的是影响耗尽焦点的质量的像差，这需要通过强烈的照明包围的近零强度。我们呈现分析，建模和实验测量，显示彗形像差对二维（2D）和三维（3D）STED配置的耗尽模式的影响。具体来说，我们发现相同的彗形像差，在2D和3D中呈相反的方向创造焦距。这种现象可能影响微观测量的精度，并且具有组合2D / 3D STED系统的疗效的后果。光学社会在创意公约归因4.0许可的条款下发表。

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来源
《Optics Letters》 |2016年第15期|共4页
作者
Antonello Jacopo; Kromann Emil B.; Burke Daniel; Bewersdorf Joerg; Booth Martin J.;
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作者单位

Univ Oxford Ctr Neural Circuits &

Behav Mansfield Rd Oxford OX1 3SR England;

Yale Sch Med Dept Cell Biol New Haven CT 06520 USA;

Univ Oxford Ctr Neural Circuits &

Behav Mansfield Rd Oxford OX1 3SR England;

Yale Sch Med Dept Cell Biol New Haven CT 06520 USA;

Univ Oxford Ctr Neural Circuits &

Behav Mansfield Rd Oxford OX1 3SR England;

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正文语种 eng
中图分类计量学;光学;
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专利

1. Coma aberrations in combined two- and three-dimensional STED nanoscopy [J] . Antonello Jacopo, Kromann Emil B., Burke Daniel, Optics Letters . 2016,第15期

机译：组合两维和三维纤维纳米镜中的昏迷
2. Characterizing the Two- and Three-Dimensional Resolution of an Improved Aberration-Corrected STEM [J] . A.R. Lupini, A.Y. Borisevich, J.C. Idrobo, Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2009,第Null期

机译：表征改进的像差校正STEM的二维和三维分辨率
3. Characterizing the Two- and Three-Dimensional Resolution of an Improved Aberration-Corrected STEM [J] . Lupini AR, Borisevich AY, Idrobo JC, Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2009,第5期

机译：表征改进的像差校正STEM的二维和三维分辨率
4. Quantitative analysis and automatic classification of skull deformity based on combined two- and three-dimensional shape indices [C] . Min Jin Lee, Helen Hong, Kyu Won Shim, IEEE International Symposium on Biomedical Imaging . 2018

机译：基于二维和三维形状指标的颅骨畸形定量分析和自动分类
5. Three-dimensional nanoscopy with a double-helix microscope. [D] . Pavani, Sri Rama Prasanna. 2009

机译：用双螺旋显微镜进行三维纳米检查。
6. Coma aberrations in combined two- and three-dimensional STED nanoscopy [O] . Jacopo Antonello, Emil B. Kromann, Daniel Burke, -1

机译：二维和三维STED纳米显微镜的彗形像差
7. Coma aberrations in combined two- and three-dimensional STED nanoscopy [O] . Antonello, J, Kromann, EB, Burke, D, 2016

机译：二维和三维STED纳米显微镜的彗形像差

Coma aberrations in combined two- and three-dimensional STED nanoscopy

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