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首页> 外文期刊>Physica, B. Condensed Matter >Detection of Potential Induced Degradation in mono and multi-crystalline silicon photovoltaic modules
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Detection of Potential Induced Degradation in mono and multi-crystalline silicon photovoltaic modules

机译：检测单体和多晶硅光伏模块中电势诱导的降解

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Potential induced degradation (PID) is a performance limiting defect that profoundly impacts the power output of Photovoltaic (PV) modules. PID occurs because of leakage current between the solar cells and the aluminium frame. The leakage current develops due to high potential difference between the string voltage and the ground. In this work, PID is induced in a mono-crystalline and a multi-crystalline module and the severity is determined by current-voltage (I-V) measurements and Electroluminescence (EL) imaging. The Power dropped by 12.6% and 18.7% after 96 h of PID stress. The extracted parameters from the curves show that the shunt resistance decreases and series resistance increases after the induction of PID. EL imaging was done at 10% of short circuit current (I-sc) (low injection levels), manifesting as checkerboard like intensity distribution and distinct bimodal intensity histogram. The results of this study demonstrate different PID detection characterisation techniques in PV modules.
机译：潜在的诱导降解（PID）是一种性能限制缺陷，其深度影响光伏（PV）模块的功率输出。由于太阳能电池和铝框架之间的漏电流发生了PID。由于串电压和地面之间的高电位差，漏电流会产生漏电流。在这项工作中，PID在单晶和多晶体模块中诱导，并且通过电流 - 电压（I-V）测量和电致发光（EL）成像来确定严重程度。 PID应力96小时后，电力下降了12.6％和18.7％。来自曲线的提取的参数表明，在PID诱导后，分流电阻降低和串联电阻增加。 EL成像以短路电流（I-SC）（L低注射水平）的10％进行，表现为棋盘，如强度分布和不同的双峰强度直方图。该研究的结果表明了光伏模块中的不同PID检测表征技术。

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