Nanoscale measurements for computing Young's modulus with atomic force microscope

A. D. Kaul; A. Gangwal; S. S. Wadhwa

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Nanoscale measurements for computing Young's modulus with atomic force microscope

机译：用原子力显微镜进行杨氏模量的纳米测量

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Atomic force microscope (AFM), developed at Central Scientific Instrument Organization, Chandigarh, has been configured for load-depth indentation measurements, wherein 'the reverse path effect' of AFM force curve associated with the use of piezo actuators has been overcome by measuring in situ actuator displacement independently by a laser Doppler displacement meter (LDDM) to enable correction of the force curves. The measurements of elastic moduli of highly oriented pyrolytic graphite, silicone elastomer, mica and gallium arsenide have been carried out.

机译：由昌迪加尔（Chandigarh）中央科学仪器组织（Central Scientific Instrument Organisation）研发的原子力显微镜（AFM）已配置用于载荷深度压痕测量，其中通过使用以下方法来克服与压电致动器相关的AFM力曲线的“反向路径效应”通过激光多普勒位移计（LDDM）独立进行原位执行器位移，以校正力曲线。已经对高度取向的热解石墨，有机硅弹性体，云母和砷化镓的弹性模量进行了测量。

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《Current Science: A Fortnightly Journal of Research》 |1999年第12期|共9页
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A. D. Kaul; A. Gangwal; S. S. Wadhwa;
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中图分类自然科学现状及发展;
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1. Nanoscale measurements for computing Young's modulus with atomic force microscope [J] . A. D. Kaul, A. Gangwal, S. S. Wadhwa Current Science: A Fortnightly Journal of Research . 1999,第12期

机译：用原子力显微镜进行杨氏模量的纳米测量
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Nanoscale measurements for computing Young's modulus with atomic force microscope

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