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首页> 外文期刊>The journal of physical chemistry, A. Molecules, spectroscopy, kinetics, environment, & general theory >Probing Surface Photovoltage Effect Using Photoassisted Secondary Electron Emission
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Probing Surface Photovoltage Effect Using Photoassisted Secondary Electron Emission

机译：使用光学涂养二级电子发射探测表面光电效应

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摘要

While the properties of surfaces and interfaces are crucial to modern devices, they are commonly difficult to explore since the signal from the bulk often masks the surface contribution. Here we introduce a methodology based on scanning electron microscopy (SEM) coupled with a pulsed laser source, which offers the capability to sense the topmost layer of materials, to study the surface photovoltage (SPV) related effects. This method relies on a pulsed optical laser to transiently induce an SPV and a continuous primary electron beam to produce secondary electron (SE) emission and monitor the change of the SE yield under laser illumination. We observe contrasting behaviors of the SPV-induced SE yield change on n-type and p-type semiconductors. We further study the dependence of the SPV-induced SE yield on the primary electron beam energy, the optical fluence, and the modulation frequency of the optical excitation, which reveal the details of the dynamics of the photocarriers in the presence of the surface built-in potential. This fast, contactless, and bias-free technique offers a convenient and robust platform to probe surface electronic phenomena, with great promise to probe nanoscale effects with a high spatial resolution. Our result further provides a basis to understand the contrast mechanisms of emerging time-resolved electron microscopic techniques, such as the scanning ultrafast electron microscopy.
机译：虽然表面和接口的属性对现代设备至关重要，但是由于来自散装的信号经常掩盖表面贡献，因此它们通常难以探索。在这里，我们将基于扫描电子显微镜（SEM）介绍一种与脉冲激光源联接的方法，该方法提供了感测最顶层材料层的能力，以研究表面光伏（SPV）相关效果。该方法依赖于脉冲光学激光瞬时诱导SPV和连续初级电子束以产生二次电子（SE）发射并监测激光照明下SE产率的变化。我们观察到N型和p型半导体对培养基诱导的SE产量变化的对比度。我们进一步研究了SPV诱导的SE产量对初级电子束能量，光学频率和调制频率的依赖性，该光学激发的调制频率，揭示了表面内置的光载体动态的细节。在潜力。这种快速，非接触和偏差技术提供了一种方便且坚固的平台，可探测表面电子现象，非常希望以高空间分辨率探测纳米级效果。我们的结果还提供了理解新出现的时间分离的电子显微镜技术的对比机制，例如扫描超吸电子显微镜。

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