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Nanoscale phase separation of CuI-Cu_2MoO_4 superionic conducting glass studied by analytical transmission electron microscopy

机译:通过分析透射电子显微镜研究Cui-Cu_2Moo_4超前导电玻璃的纳米级相分离

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摘要

Microstructures of CuI-Cu_2MoO_4 superionic conducting glasses have been studied by analytical transmission electron microscopy equipped with high angle annular detector dark field (HAADF) detector and energy dispersive X-ray spectroscopy (EDS). Structural inhomogeneities of 5-10 nm in size are observed from HAADF images in the glass. Deference of composition between bright and dark contrast regions is clearly confirmed by EDS experiments. The nanoscale phase separation of 5-10 nm in size has been clarified by HAADF and EDS experiments.
机译:通过配备高角度环形探测器暗场(HAADF)检测器和能量分散X射线光谱(EDS)的分析透射电子显微镜研究了CUI-CU_2MOOO_4超影传导玻璃的微观结构。 从玻璃中的HAADF图像观察到尺寸为5-10nm的结构不均匀性。 通过EDS实验清楚地证实了明亮和暗对比区域之间的组成的偏见。 通过HAADF和EDS实验阐明了纳米尺寸为5-10nm的纳米级相分离。

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