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首页> 外文期刊>Acta Crystallographica, Section B. Structural science, crystal engineering and materials >Methods for orientation and phase identification of nano-sized embedded secondary phase particles by 4D scanning precession electron diffraction
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Methods for orientation and phase identification of nano-sized embedded secondary phase particles by 4D scanning precession electron diffraction

机译：4D扫描预析电子衍射纳米大小嵌入二相粒子的取向和相位鉴定方法

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摘要

The diffraction patterns acquired with transmission electron microscopes gather reflections from all crystallites that overlap in the foil thickness. The superimposition renders automated orientation or phase mapping difficult, in particular when secondary phase particles are embedded in a dominant diffracting matrix. Several numerical approaches specifically developed to overcome this issue for 4D scanning precession electron diffraction data sets are described. They consist either in emphasizing the signature of the particles or in subtracting the matrix information out of the collected set of patterns. The different strategies are applied successively to a steel sample containing precipitates that are in Burgers orientation relationship with the matrix and to an aluminium alloy with randomly oriented Mn-rich particles.
机译：用透射电子显微镜获取的衍射图案收集来自箔厚度重叠的所有微晶的反射。 叠加呈现自动取向或相位映射难度，特别是当二次相粒子嵌入主导衍射基质中时。 描述了几种专门开发的用于克服4D扫描预测电子衍射数据集的数值方法。 它们包括强调粒子的签名或从收集的模式集中减去矩阵信息。 不同的策略依次施加到含有沉淀物的钢样品，该沉淀物与基质的汉总取向关系和随机取向的Mn的富含颗粒的铝合金。

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