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Study of the Grazing-Incidence X-ray Scattering of Strongly Disturbed Fractal Surfaces

机译：强烈扰动分形表面的放牧发病率X射线散射研究

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摘要

The applicability of different approaches to the description of hard X-ray scattering from rough surfaces is generally limited by a maximum surface roughness height of no more than 1 nm. Meanwhile, this value is several times larger for the surfaces of different materials subjected to treatment, especially in the initial treatment stages. To control the roughness parameters in all stages of surface treatment, a new approach has been developed, which is based on a series expansion of wavefield over the plane eigenstate-function waves describing the small-angle scattering of incident X-rays in terms of plane q-waves propagating through the interface between two media with a random function of relief heights. To determine the amplitudes of reflected and transmitted plane q-waves, a system of two linked integral equations was derived. The solutions to these equations correspond (in zero order) to the well-known Fresnel expressions for a smooth plane interface. Based on these solutions, a statistical fractal model of an isotropic rough interface is built in terms of root-mean-square roughness sigma, two-point correlation length l, and fractal surface index h. The model is used to interpret X-ray scattering data for polished surfaces of single-crystal cadmium telluride samples.
机译：不同方法对来自粗糙表面的硬X射线散射的描述通常限制在最大表面粗糙度高度不超过1nm的限制。同时，对于经过治疗的不同材料的表面，该值是较大的几倍，特别是在初始治疗阶段。为了控制表面处理的所有阶段的粗糙度参数，已经开发了一种新方法，这是基于在平面上的波场的串联扩展，其描述了在平面方面的入射X射线的小角度散射的小角度散射Q-波通过两个介质之间的界面传播，其具有浮雕高度随机函数。为了确定反射和透射平面Q-Wave的幅度，导出了两个链接积分方程的系统。对这些等式的解决方案对应于用于平滑平面接口的公知的菲涅耳表达式。基于这些解决方案，根据根均方粗糙度Sigma，双点相关长度L和分形表面指数H构建各向同性粗糙接口的统计分形模型。该模型用于解释用于单晶碲化镉样品的抛光表面的X射线散射数据。

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  • 来源
    《Crystallography reports》 |2017年第2期|共5页
  • 作者

    Roshchin B. S.; Chukhovsky F. N.; Pavlyuk M. D.; Opolchentsev A. M.; Asadchikov V. E.;

  • 作者单位

    Russian Acad Sci Fed Res Ctr Crystallog &

    Photon Shubnikov Inst Crystallog Moscow 119333 Russia;

    Russian Acad Sci Fed Res Ctr Crystallog &

    Photon Shubnikov Inst Crystallog Moscow 119333 Russia;

    Russian Acad Sci Fed Res Ctr Crystallog &

    Photon Shubnikov Inst Crystallog Moscow 119333 Russia;

    Russian Acad Sci Fed Res Ctr Crystallog &

    Photon Shubnikov Inst Crystallog Moscow 119333 Russia;

    Russian Acad Sci Fed Res Ctr Crystallog &

    Photon Shubnikov Inst Crystallog Moscow 119333 Russia;

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  • 正文语种 eng
  • 中图分类 晶体学;
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