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首页> 外文期刊>Crystal growth & design >Formation of high-quality GaN microcrystals by pendeoepitaxial overgrowth of GaN nanowires on Si(111) by molecular beam epitaxy
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Formation of high-quality GaN microcrystals by pendeoepitaxial overgrowth of GaN nanowires on Si(111) by molecular beam epitaxy

机译:通过分子束外延在Si(111)上通过GaN纳米线的外延外延生长形成高质量的GaN微晶

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摘要

Hexagonal GaN microcrystals of a size between 1 to 3 μm are obtained by the pendeoepitaxial overgrowth of a GaN nanowire template on Si(111). The GaN microcrystals are free of threading dislocations and exhibit an atomically smooth surface (roughness of 0.2 nm). Photoluminescence spectra of these microcrystals are dominated by an intense donor-bound exciton transition at 3.471 eV with a width of 1 meV reflecting strain-free GaN of exceptional structural quality.
机译:通过在Si(111)上进行GaN纳米线模板的五方外延生长,可以获得尺寸为1-3μm的六方GaN微晶。 GaN微晶无螺纹位错,并显示出原子光滑的表面(粗糙度为0.2 nm)。这些微晶的光致发光光谱主要由3.471 eV的强烈供体结合的激子跃迁所主导,其宽度为1 meV,反映出具有卓越结构质量的无应变GaN。

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