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首页> 外文期刊>Crystal growth & design >Characteristics of strain-induced in _xGa _(1-x)as nanowires grown on Si(111) substrates
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Characteristics of strain-induced in _xGa _(1-x)as nanowires grown on Si(111) substrates

机译:在Si(111)衬底上生长的_xGa _(1-x)纳米线中的应变诱导特性

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摘要

Large strain-energy arising from lattice mismatch allows one-dimensional heteroepitaxial growth of In _xGa _(1-x)As on silicon substrates without any catalyst or pattern assistance. In this paper, we show that in contrast to nanowires (NWs) grown by metal-catalyzed vapor-liquid-solid mechanism, strain-induced In _xGa _(1-x)As NWs have several unique morphological features including no tapering, slight bending, and composition-dependent NW height saturation. Although small fluctuation exists, no systematic composition variations are observed over the entire In _xGa _(1-x)As NW length within the resolution of the energy-dispersive X-ray spectroscopy analysis.
机译:由晶格失配引起的大应变能允许在硅基板上进行In_xGa _(1-x)As的一维异质外延生长,而无需任何催化剂或图案辅助。在本文中,我们表明,与通过金属催化的气液固机制生长的纳米线(NW)相比,应变诱导的In _xGa _(1-x)As纳米线具有几种独特的形态特征,包括无锥度,轻微弯曲以及取决于成分的NW高度饱和度。尽管存在很小的波动,但是在能量色散X射线光谱分析的分辨率范围内,在整个In _xGa _(1-x)As NW长度上未观察到系统的成分变化。

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