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首页> 外文期刊>Advanced Science Letters >Fault Modeling of Analog Circuits Using System Identification Automated Model Generation Approaches from SPICE Level Descriptions
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Fault Modeling of Analog Circuits Using System Identification Automated Model Generation Approaches from SPICE Level Descriptions

机译：使用SPICE级别描述中的系统识别自动模型生成方法对模拟电路进行故障建模

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摘要

Fault modeling and simulation (FMAS) of analog circuits is considered to be time consuming and expensive as compared to digital circuits. FMAS of analog circuits is heavily dependent on transistor level (TL) circuits and slow speed of TL fault simulation (TLFS) increase overall testing cost. Therefore, Automated Model Generation (AMG) techniques are employed to model nonlinear faults in analog circuits and achieve speed up in simulation. In this paper, we model faults of an operational amplifier (opamp) circuit using System Identification (SI) based AMG techniques: nonlinear autoregressive with exogenous input (NLARX) and Hammerstein-Wiener (H-W) techniques from SPICE transistor level descriptions. To investigate performance of AMGs for nonlinear behavior of faults, several nonlinear functions are employed such as sigmoid network, wavelet network, and tree partition etc. A comparison of simulation speeds of TLFS and AMGs is also provided. Simulation results show that more accurate and efficient AMGs should be considered for the modeling of nonlinear behavior of analog faulty circuits and achieve speedup in simulations.
机译：与数字电路相比，模拟电路的故障建模和仿真（FMAS）被认为既耗时又昂贵。模拟电路的FMAS严重依赖于晶体管级（TL）电路，而TL故障仿真（TLFS）的速度较慢，会增加总体测试成本。因此，采用了自动模型生成（AMG）技术对模拟电路中的非线性故障进行建模，并加快了仿真速度。在本文中，我们使用基于系统识别（SI）的AMG技术对运算放大器（opamp）电路的故障进行建模：带外源输入的非线性自回归（NLARX）和基于SPICE晶体管级描述的Hammerstein-Wiener（H-W）技术。为了研究AMG对故障非线性行为的性能，采用了Sigmoid网络，小波网络和树划分等几种非线性函数。还对TLFS和AMG的仿真速度进行了比较。仿真结果表明，在模拟故障电路的非线性行为建模中，应考虑使用更准确，更有效的AMG，以加快仿真速度。

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