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首页> 外文期刊>Crystallography reports >Specific features in shaping Bi12GeO20 crystals grown by low thermal gradient Czochralski technique
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Specific features in shaping Bi12GeO20 crystals grown by low thermal gradient Czochralski technique

机译:通过低热梯度直拉法生长的Bi12GeO20晶体成型的特殊特征

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摘要

Germanosillenite (BGO) crystals have been grown by the low thermal gradient Czochralski technique [1] at crystallization rates of v = 0.05-4 mm/h. The evolution regularities of the faceted front forms have been studied taking into consideration their growth conditions (crystallization rate and thermal conditions). The orientations of the faces forming the crystallization front during crystal growth in the aOE (c) 111 > direction have been determined. The relationship between the front morphology (and, therefore, growth conditions) and the quality of crystals formed is established. The quality of the BGO crystals grown is evaluated by X-ray topography.
机译:通过低热梯度切克劳斯基技术[1]以v = 0.05-4 mm / h的结晶速率生长了锗硅锰矿(BGO)晶体。考虑到刻面前型的生长条件(结晶速率和热条件),研究了它们的演变规律。已经确定了在aOE(c)111>方向上的晶体生长过程中形成晶化前沿的面的取向。建立了正面形态(以及因此的生长条件)与所形成晶体的质量之间的关系。通过X射线形貌评估生长的BGO晶体的质量。

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