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Study of the internal structure of lithium fluoride single crystal by laboratory X-ray topo-tomography

机译:实验室X射线断层扫描技术研究氟化锂单晶的内部结构

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摘要

Defects in a synthetic LiF crystal have been studied by X-ray topo-tomography on laboratory X-ray sources with a spatial resolution of ~10 μm. An algebraic reconstruction method was applied to reconstruct the defect 3D structure of the crystal based on the diffraction data. The results presented in this study are in good agreement with the topographic data obtained by the Lang method.
机译:通过X射线断层摄影术在空间分辨率约为10μm的实验室X射线源上研究了合成LiF晶体中的缺陷。基于衍射数据,采用代数重构方法重构晶体的缺陷3D结构。在这项研究中提出的结果与通过Lang方法获得的地形数据非常吻合。

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